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1

Inverse-fourth apparatus for photometric calibrations

Swyt, Dennis A., LaRock, James G.

Journal:

Review of Scientific Instruments

Year:

1978

Language:

english

File:

PDF, 762 KB

english, 1978

2

Robotics in the factory of the future: AI in manufacturing: The NBS AMRF as an intelligent machine

Journal:

Robotics and Autonomous Systems

Year:

1989

Language:

english

File:

PDF, 471 KB

english, 1989

3

CIM, data and standardization within the NBS AMRF

Journal:

Robotics and Autonomous Systems

Year:

1988

Language:

english

File:

PDF, 529 KB

english, 1988

4

Transferring NBS technology to small manufacturers through state and local centers

Journal:

The Journal of Technology Transfer

Year:

1988

Language:

english

File:

PDF, 681 KB

english, 1988

5

Sizing of individual optically levitated evaporating droplets by measurement of resonances in the polarization ratio

Lettieri, Thomas R., Jenkins, Wilhelmina D., Swyt, Dennis A.

Journal:

Year:

1981

Language:

english

File:

PDF, 822 KB

english, 1981

6

The workforce of U.S. manufacturing in the post-industrial era

Journal:

Technological Forecasting and Social Change

Year:

1988

Language:

english

File:

PDF, 1.24 MB

english, 1988

7

SPIE Proceedings [SPIE 1981 Microlithography Conferences - San Jose (Monday 30 March 1981)] Semiconductor Microlithography VI - Quantitative Sub-Micrometer Linewidth Determination Using Electron Microscopy

Jensen, Stephen, Hembree, Gary, Marchiando, Jay, Swyt, Dennis, Dey, James W.

Year:

1981

Language:

english

File:

PDF, 524 KB

english, 1981

8

SPIE Proceedings [SPIE 1980 Los Angeles Technical Symposium - Los Angeles (Monday 4 February 1980)] Optics in Metrology and Quality Assurance - Measurements Of Small Dimensions Of Products And By-Products

Swyt, Dennis A., Jensen, Stephen W., Kasdan, Harvey L.

Year:

1980

Language:

english

File:

PDF, 232 KB

english, 1980

9

SPIE Proceedings [SPIE Micromachining and Microfabrication - Austin, TX (Monday 23 October 1995)] Microlithography and Metrology in Micromachining - Generic technology, measurement, and standards issues in micromachining and microfabrication

Swyt, Dennis A., Postek, Michael T.

Year:

1995

Language:

english

File:

PDF, 201 KB

english, 1995

10

SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Recent Developments in Traceable Dimensional Measurements - Developments at NIST on traceability in dimensional measurements

Swyt, Dennis A., Phillips, Steven D., Palmateer, John W., Decker, Jennifer E., Brown, Nicholas

Year:

2001

Language:

english

File:

PDF, 439 KB

english, 2001

11

SPIE Proceedings [SPIE Effective Utilization of Optics in Quality Assurance - Arlington Heights (Monday 14 November 1977)] Effective Utilization of Optics in Quality Assurance I - An NBS Physical Standard For The Calibration Of Photomask Linewidth Measuring Systems

Swyt, Dennis A., Cruz, Jose

Year:

1978

Language:

english

File:

PDF, 251 KB

english, 1978

12

Experiences in initiating Baldrige‐based quality in a NIST technical division

Swyt, Dennis A.

Journal:

The TQM Journal

Year:

1999

Language:

english

File:

PDF, 139 KB

english, 1999

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